ARFTG 73rd Conference
12 June 2009, Boston Convention and Exhibition Center, USA
Technical Program
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Session 1 Nonlinear Measurements 1 8:00am – 9:40am Chair: John Wood, Freescale Semiconductor |
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Session 2 Nonlinear Measurements 2 10:20am – 12:00noon Chair: Mohamed Sayed, MMS |
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Session 3 VNA Calibration 1:30pm – 2:45pm Chair: Jon Martens, Anritsu |
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Session 4 Other Measurement Topics 3:15pm – 4:40pm Chair: Ken Wong, Agilent Technologies |
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Poster A 9:20am – 10:40am Chair: Rusty Myers, Maury Microwave |
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Poster B 2:20pm – 3:25pm Chair: Rusty Myers, Maury Microwave |