NVNA User's Forum Past Events
ARFTG-101st/IMS-2023, June 15th, 2023
- VNA-based characterization of frequency multipliers and frequency multiplier-based transmitters
Ahmed Ben Ayed and Slim Boumaiza, Department of Electrical and Computer Engineering, Antennas, Microwaves and Wave Optics Emerging Radio Systems Group - Broadband EVM measurement for VSGs using a VNA-based technique
Gian Piero Gibiino (speaker), Alberto Maria Angelotti, University of Bologna, Italy
ARFTG-100th/RWW-2023, January 23rd, 2023
- Wideband NVNA Built from a VNA-SA,
Jean-Pierre Teyssier (Keysight Technologies, USA) - Research update
Apolinar Reynoso Hernandez (CICESE, Ensenada, Mexico)
ARFTG-97th/ IMS-2021, June 24th, 2021, Live Session with Q&A
- Research update: Emulation load-pull & mm-wave MIMO over-the-air characterization
Jose-Ramon Perez-Cisneros and Koen Buisman, Chalmers University of Technology - Research update: Performing multi-channel spectral analysis with GHz bandwidth with VNA
Jean-Pierre Teyssier, Keysight - Discussion:
Wide bandwidth modulated signals
Nonlinear Measurement Techniques for 5G
ARFTG-96th/RWW-2021, January 18st, 2021, Live Session with Q&A
- 10 and 30 GHz active load-pull slides with an NVNA
Nicholas Miller, Air Force Research Laboratory - Vector Signal Network Analyzer: a joint 5 channel VNA-VSA for MIMO devices characterization with CW and wide-bandwidth modulated signals
Thaimi Niubo Aleman, CICESE, Mexico - Wideband active load-pull research at University of Bologna
Alberto Maria Andlotti, University of Bologna - Discussion: Wide bandwidth modulated signals
ARFTG-94th, January 27th, 2020, San Antonio, Texas
- Practical wideband time-domain measurement and nonlinear system-level modeling techniques for traveling wave tube & solid-state power amplifiers
Christopher Silva, The Aerospace Corporation - Debate: Characterization of modulated multi-harmonic signals
- Debate: Behavioral modeling of modulated multi-harmonic signals and broadband application
ARFTG-93rd, June 6th, 2019, Boston, Massachusetts
- Large-Signal Characterization of SOI MOSFETs using NVNA and active load-pull
Dr. Manuel Pulido, Andres Zarate, pSemi Corp. A Murata Co. - Debate: Use of NVNA in device characterization and model validation
- Large Signal Characterization of Dual-Input PAs
Chenyu Liang, The Ohio State University, and Thaimi Niubo Aleman, The Ohio State University and CICESE Ensenada - NIST Approach to calibrating an LSNA on an arbitrary frequency grid
Aric Sanders, National Institute of Standards and Technology
ARFTG-92nd/RWW-2019, January 21st, 2019, Orlando, Florida
- Use of IVCAD 3.8 with NVNA and de-embedding of time-domain measurements to the intrinsic reference planes
Tony Gasseling, AMCAD-Engineering - Debate: Use of NVNA in device modeling and verification
- Debate: Sharing of data acquisition codes for NVNA
- Non-linear verification device developed in cooperation with Keysight & NPL
Dominique Schreurs, KU Leuven