ARFTG-97th/ IMS-2021. June 24th, 2021, Live Session with Q&A

  • Research update: Emulation load-pull & mm-wave MIMO over-the-air characterization
    Jose-Ramon Perez-Cisneros and Koen Buisman, Chalmers University of Technology
  • Research update: Performing multi-channel spectral analysis with GHz bandwidth with VNA
    Jean-Pierre Teyssier, Keysight
  • Discussion:
    Wide bandwidth modulated signals
    Nonlinear Measurement Techniques for 5G

 

ARFTG-96th/RWW-2021, January 18st, 2021, Live Session with Q&A

  • 10 and 30 GHz active load-pull slides with an NVNA
    Nicholas Miller, Air Force Research Laboratory
  • Vector Signal Network Analyzer: a joint 5 channel VNA-VSA for MIMO devices characterization with CW and wide-bandwidth modulated signals
    Thaimi Niubo Aleman, CICESE, Mexico
  • Wideband active load-pull research at University of Bologna
    
Alberto Maria Andlotti, University of Bologna
  • Discussion: 
Wide bandwidth modulated signals

 

ARFTG-94th, January 27th, 2020, San Antonio, Texas

  • Practical wideband time-domain measurement and nonlinear system-level modeling techniques for traveling wave tube & solid-state power amplifiers
    Christopher Silva, The Aerospace Corporation
  • Debate: Characterization of modulated multi-harmonic signals
  • Debate: Behavioral modeling of modulated multi-harmonic signals and broadband application

 

ARFTG-93rd, June 6th, 2019, Boston, Massachusetts

  • Large-Signal Characterization of SOI MOSFETs using NVNA and active load-pull
    Dr. Manuel Pulido, Andres Zarate, pSemi Corp. A Murata Co.
  • Debate: Use of NVNA in device characterization and model validation
  • Large Signal Characterization of Dual-Input PAs
    Chenyu Liang, The Ohio State University, and Thaimi Niubo Aleman, The Ohio State University and CICESE Ensenada
  • NIST Approach to calibrating an LSNA on an arbitrary frequency grid
    Aric Sanders, National Institute of Standards and Technology

 

ARFTG-92nd/RWW-2019, January 21st, 2019, Orlando, Florida

  • Use of IVCAD 3.8 with NVNA and de-embedding of time-domain measurements to the intrinsic reference planes
    Tony Gasseling, AMCAD-Engineering
  • Debate: Use of NVNA in device modeling and verification
  • Debate: Sharing of data acquisition codes for NVNA
  • Non-linear verification device developed in cooperation with Keysight & NPL
    Dominique Schreurs, KU Leuven