Plans for upcoming On-Wafer Users' Forums
15th On-Wafer User's Forum EuMW-2023
Messe Berlin, HUB27, Berlin, Germany
When: Monday, September 18th, 2023
Time: 9:00 - 10:40
Room: Gamma 8
With the great support of the EuMW-2023 Steering Committee, we are bringing the 15th ARFTG On-Wafer User’s Forum closer to the European microwave engineering community. The topics for our meeting in Berlin will include methods for verifying wafer-level calibration accuracy, measurement traceability, and sub-THZ measurements.
The ARFTG On-Wafer Forum is free for the European Microwave Week delegates, exhibitors, and exhibition visitors.
For those of you who are new to us, we are an informal discussion group devoted to sharing information and issues related to the on-wafer measurement and calibration practices. The Forum is also a platform to define workgroups and gather experts in the field to progress the field of on-wafer measurements and calibrations.
- Facilitate discussion with like-minded engineers
- Open exchange of experience, ideas, discussion of problems
- Informal atmosphere
- 9:00 - 9:05
Andrej Rumiantsev (MPI Corporation) and Gia Ngoc Phung (PTB)
- 9:05 - 9:20
Transferring the accuracy of multiline TRL to industrial on-wafer calibrations
Gia Ngoc Phung (PTB), Andrej Rumiantsev (MPI Corporation)
Multiline TRL is widely recognized as one of the most accurate on-wafer calibrations. In industrial applications, however, fixed-distance calibrations such as SOLT, LRM, etc. using commercially available coplanar calibration standards are usually preferred. In this talk, we will show how the uncertainties obtained for reference multiline TRL calibrations can be transferred to industrial calibrations, as mentioned above. The key success factor is the accurate characterization of lumped-element standards made on custom and application-specific technologies.
- 9:20 - 10:00
- 10:00 - 10:15
Recommendations for suppressing parasitic effects in on-wafer measurements
Gia Ngoc Phung (PTB)
We will discuss the parasitic effects caused by e.g. multimode propagation, nonidealities of the microwave probes, and crosstalk effects between adjacent structures. The impact of each effect is discussed, and measures are provided to mitigate these effects as much as possible.
- 10:15 - 10:35
- 10:35 - 10:40