On-Wafer User's Forum Past Events
14th On-Wafer User's Forum
ARFTG-101st/IMS-2023, June 15th, 2023
- Traceability for on-wafer S-parameter measurements
Uwe Arz, PTB - On Probe-Tip Calibration Reference Impedance
Lucas Nyssens, UCL
Joint On-Wafer and THZ Measurement Topics
- Automated & Nanorobotics Millimeter-Wave On-Wafer Probe Station
Kamel Haddadi, University of Lille - Beyond 110 GHz: Research and Activity at NIST
Jim Booth, NIST
13th On-Wafer User's Forum
ARFTG-100th/RWW-2023. January 23rd, 2023
- Discussion on Anritsu 220-GHz Single-Sweep VNA
Moderator: Jon Martens (Anritsu, USA) - Discussion on Preliminary Experience with the Anritsu 220 GHz Single-Sweep VNA
Moderator: Lei Li (Cornell University, USA) - Introduction of the THZ User’s Forum Idea
Jim Hwang (Cornell University, USA)
12th On-Wafer User's Forum
ARFTG-99th/IMS-2022. January 23rd, 2023
- Update on the IEEE Working Group P2822 "Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-embedding and Measurements"
- System Integrity Veirificaion
11th On-Wafer User's Forum
ARFTG-97th/ IMS-2021. June 24th, 2021, Live Session with Q&A
Focused session: Measurement errors and methods for verifying accuracy and integrity of the on-wafer measurement system
- Introduction: measurement errors and verification methods
Andrej Rumiantsev, MPI Corporation - Calibration comparison method
Dylan Williams, Jeffrey Jargon, NIST - Standard model method
Andrej Rumiantsev, MPI Corporation - Roundtable discussion
10th On-Wafer User's Forum
ARFTG-96th/RWW-2021. January 21st, 2021, Live Session with Q&A
- Recent development on the “Calibration on-the-fly” method for on-wafer measurements
Chong Li, University of Glasgow - Application of machine learning methods to the RF probe alignment process
Ryo Sakamaki, NMIJ AIST - Discussion: New methods for RF probe positioning and contact consistency improvement
9th On-Wafer User's Forum
ARFTG-94th/RWW-2020 San Antonio, TX, USA. 27th January 2020
- On-wafer calibration at sub-mm wave frequencies
Marco Spirito, TU Delft, the Netherlands - Notes on calibration reference impedance
Andrej Rumiantsev, MPI Corporation, Taiwan - Reproducibility of the multiline TRL calibration at the millimeter-wave frequency for one-month period
Masahiro Horibe, AIST, Japan
8th On-Wafer User's Forum (Second European Forum)
EuMW-2019 Paris, France. 3rd October 2019
- Material characterization by resonant method using precision on-wafer measurement technique at 300 GHz
Masahiro Horibe, AIST, Japan - Overview of Planar S-parameter Measurements Up to 1.1 THz in European TEMMT Research Project
Xiaobang Shang, Nick Ridler, NPL, UK - On-wafer calibration reference plane: what is the optimal location?
Andrej Rumiantsev, MPI Corporation, Taiwan - Quick update on P2822 working group
Andrej Rumiantsev, Jon Martens
7th On-Wafer User's Forum
ARFTG-93rd Boston, MA, USA. June 6th 2019
- On-wafer calibration techniques from 4K to 175C
Gavin Fisher (FormFactor, USA) - Evaluation of silicon substrate losses at millimeter-wave frequencies
Lucas Nyssens (UCL, Belgium) - Towards ultra-precise probing in on-wafer measurements
Carmine de Martino (TU Delft, The Netherlands) - Transfer of uncertainties with commercial calibration substrates
Faisal Mubarak (VSL, The Netherlands) - Reproducible on-wafer measurement demonstrated over 300 GHz
Masahiro Horibe (AIST, Japan) - PAR2822 “Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations and Measurements”
Andrej Rumiantsev, Marco Spirito, Jon Martens
6th On-Wafer User's Forum
ARFTG-92nd-RWW-2019, Orlando, FL. January 21st 2019
- Investigation of Line Length Effects in Multiline TRL Calibrations at 1.1 THz
Matt Bauwens, DM Probes - How to effectively include DRC fills effect in EM simulations
Marco Spirito, TU Delft - Debate mm-wave probing Contact less vs. Contact
Sertel Kubilay and Marco Spirito Moderator: Jon Martens
5th Forum On-Wafer User's Forum (First European Forum)
EuMW-2018 Madrid, Spain. September 27th 2018
- What did we learned about wafer-level calibration from PlanarCal project?
Gia Ngoc Phung, FBH Berlin, Germany - On the location of the on-wafer calibration reference plane
Andrej Rumiantsev,MPI Corporation, Taiwan - Repeatable multiline-TRL calibration by super-beginner operators
Ryo Sakamaki, AIST, Japan - What is the reference impedance of the lumped-standard based calibration?
J. Apolinar Reynoso Hernandez, CICESE, Mexico
4th On-Wafer User's Forum
ARFTG-91st Philadelphia, PA, USA. June 14th 2018
- Discussion: On-Wafer Measurement and Calibration Standard Group
Moderator: Andrej Rumiantsev, MPI Corporation, Taiwan
3rd On-Wafer User's Forum
ARFTG-90th Boulder, CO, USA. November 29th 2017
- Cryogenic On-Wafer Measurements
James C. Booth, NIST, USA - EMPIR Project 14IND02 PlanarCal: Overview and Update
Uwe Arz, PTB, Germany
2nd On-Wafer User's Forum
ARFTG-89th Honolulu, HI, USA. June 8th 2017
- Anomalies in calibration substrates: When do we have to care about parasitic coupling from neighbor elements?
Uwe Arz, PTB, Germany - Probe-to-pad interfaces of on-wafer elements: the critical point in the wafer-level calibration with a lot of optimisation possibilities
Matthias Ohlrogge, Fraunhofer IAF, Germany - On repeatability of the on-wafer measurements
Masahiro Horibe, National Metrology Institute of Japan (NMIJ), Japan - Do we need document standards for on-wafer measurements and technology?
Nick Ridler, National Physical Laboratory (NPL), UK
On-Wafer User's Forum Kick-off meeting
ARFTG-88th Austin, TX, USA. December 7th 2016
- On-Wafer User’s Forum
Leonard Hayden (Qorvo), Andrej Rumiantsev (MPI Corporation) - On-Wafer Metrology at NIST
James Booth (NIST) - Observations on a User’s Forum
Joe Gering (Qorvo)