10th On-Wafer User's Forum
ARFTG-96th/RWW-2021. January 21st, 2021, Live Session with Q&A

  • Recent Development on the “Calibration On-the-Fly” Method for On-Wafer Measurements
    
Chong Li, University of Glasgow
  • Application of Machine Learning Methods to the RF Probe Alignment Process 

    Ryo Sakamaki, NMIJ AIST
  • Discussion: 
New methods for RF probe positioning and contact consistency improvement

 

9th On-Wafer User's Forum
ARFTG-94th/RWW-2020 San Antonio, TX, USA. 27th January 2020

  • On-wafer calibration at sub-mm wave frequencies
    Prof. Marco Spirito, TU Delft, the Netherlands
  • Notes on calibration reference impedance
    Andrej Rumiantsev, MPI Corporation, Taiwan
  • Reproducibility of the multiline TRL calibration at the millimeter-wave frequency for one-month period
    Masahiro Horibe, AIST, Japan
  • Roundtable discussion

 

8th On-Wafer User's Forum (Second European Forum)
EuMW-2019 Paris, France. 3rd October 2019

  • Material characterization by resonant method using precision on-wafer measurement technique at 300 GHz
    Masahiro Horibe, AIST, Japan
  • Overview of Planar S-parameter Measurements Up to 1.1 THz in European TEMMT Research Project
    Xiaobang Shang, Nick Ridler, NPL, UK
  • On-wafer calibration reference plane: what is the optimal location?
    Andrej Rumiantsev, MPI Corporation, Taiwan
  • Quick update on P2822 working group
    Andrej Rumiantsev, Jon Martens

 

7th On-Wafer User's Forum
ARFTG-93rd Boston, MA, USA. June 6th 2019

  • On-wafer calibration techniques from 4K to 175C 
    Gavin Fisher 
(FormFactor, USA)
  • Evaluation of silicon substrate losses at millimeter-wave frequencies 
    Lucas Nyssens 
(UCL, Belgium)
  • Towards ultra-precise probing in on-wafer measurements 
    Carmine de Martino 
(TU Delft, The Netherlands)
  • Transfer of uncertainties with commercial calibration substrates 
    Faisal Mubarak 
(VSL, The Netherlands)
  • Reproducible on-wafer measurement demonstrated over 300 GHz
    Masahiro Horibe 
(AIST, Japan)
  • PAR2822 “Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations and Measurements” 
    Andrej Rumiantsev, 
Marco Spirito,
Jon Martens

 

6th On-Wafer User's Forum
ARFTG-92nd-RWW-2019, Orlando, FL. January 21st 2019

  • Investigation of Line Length Effects in Multiline TRL Calibrations at 1.1 THz
    Matt Bauwens, DM Probes 
  • How to effectively include DRC fills effect in EM simulations
    Marco Spirito, TU Delft
  • Debate mm-wave probing Contact less vs. Contact
    Sertel Kubilay and Marco Spirito Moderator: Jon Martens

 

5th Forum On-Wafer User's Forum (First European Forum)
EuMW-2018 Madrid, Spain. September 27th 2018

  • What did we learned about wafer-level calibration from PlanarCal project?
    Gia Ngoc Phung, FBH Berlin, Germany
  • On the location of the on-wafer calibration reference plane
    Andrej Rumiantsev,MPI Corporation, Taiwan
  • Repeatable multiline-TRL calibration by super-beginner operators
    Ryo Sakamaki, AIST, Japan
  • What is the reference impedance of the lumped-standard based calibration?
    J. Apolinar Reynoso Hernandez, CICESE, Mexico

 

4th On-Wafer User's Forum
ARFTG-91st Philadelphia, PA, USA. June 14th 2018

  • Discussion: On-Wafer Measurement and Calibration Standard Group
    Moderator: Andrej Rumiantsev, MPI Corporation, Taiwan

 

3rd On-Wafer User's Forum 
ARFTG-90th Boulder, CO, USA. November 29th 2017

  • Cryogenic On-Wafer Measurements
    James C. Booth, NIST, USA
  • EMPIR Project 14IND02 PlanarCal: Overview and Update
    Uwe Arz, PTB, Germany

 

2nd On-Wafer User's Forum
ARFTG-89th Honolulu, HI, USA. June 8th 2017

  • Anomalies in calibration substrates: When do we have to care about parasitic coupling from neighbor elements?
    Uwe Arz, PTB, Germany
  • Probe-to-pad interfaces of on-wafer elements: the critical point in the wafer-level calibration with a lot of optimisation possibilities
    Matthias Ohlrogge, Fraunhofer IAF, Germany
  • On repeatability of the on-wafer measurements
    Masahiro Horibe, National Metrology Institute of Japan (NMIJ), Japan
  • Do we need document standards for on-wafer measurements and technology?
    Nick Ridler, National Physical Laboratory (NPL), UK

 

On-Wafer User's Forum Kick-off meeting
ARFTG-88th Austin, TX, USA. December 7th 2016

  • On-Wafer User’s Forum
    Leonard Hayden (Qorvo), Andrej Rumiantsev (MPI Corporation)
  • On-Wafer Metrology at NIST
    James Booth (NIST)
  • Observations on a User’s Forum
    Joe Gering (Qorvo)