100th ARFTG Microwave Measurement Conference

January 22nd-25th, 2023

Planet Hollywood Hotel, Las Vegas, Nevada, US 

Co-located with IEEE Radio & Wireless Week RWW-2023

rww2019 logo

 

Measurement Challenges for Emerging RF-to-THz Technologies

 

 

Co-Chairs: This email address is being protected from spambots. You need JavaScript enabled to view it.This email address is being protected from spambots. You need JavaScript enabled to view it.

Technical Program Co-Chairs: This email address is being protected from spambots. You need JavaScript enabled to view it.This email address is being protected from spambots. You need JavaScript enabled to view it.

Call for Papers: ARFTG-100th First Call for Papers

Conference Program Book: ARFTG-100th Program Book

 

Conference Highlights

RWW/ARFTG Joint Plenary Speaker from ARFTG

 

The 100th ARFTG Microwave Measurement Conference has the honor to host two invited industrial speakers who will provide insight into the evolution of RF components and modules and their new characterization challenges. These insights will be a good basis for research and hopefully basis for future ARFTG topics.

 

NIST-ARFTG Short Course on Microwave Measurements

Join us for a practical tutorial on microwave measurements for wireless communications! This short course is intended for engineers, graduate students, experienced technicians, or technical managers, and will be a learning experience for anyone who wants to improve their knowledge of precision microwave measurements.

This year the short course will be presented in person. Presentations are focused in four broad areas:

  • Microwave fundamentals and traceable measurements,
  • Over-the-air (OTA) measurements,
  • On-wafer measurements, and
  • Nonlinear measurements.

In addition, we plan to host a live question and answer session with a panel consisting of the short course instructors.

 

ARFTG-100th Conference focus topics:

  • Calibration and characterization, incl. cryogenic, for quantum technology
  • EM characterization, incl. de-embedding, of materials and biological samples
  • On-wafer measurements of RF to subTHz devices and circuits
  • Waveguide and free-space subTHz and THz measurements
  • Generation and measurement of sub-THz signals with wideband modulation
  • Nonlinear characterizations, incl. linearization, of devices, circuits, and systems
  • Over the air (OTA) calibration and measurement for 5G/6G and Internet of Things (IoT)
  • Other recent developments in metrology incl. measurement uncertainty

 

Important dates: